Electron microscope Product List and Ranking from 4 Manufacturers, Suppliers and Companies

Electron microscope Product List

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"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

By investigating the true cause of the troubles that occurred with the equipment, it becomes possible to formulate effective countermeasures!

By analyzing the damaged areas caused by equipment troubles in detail, we can investigate the true causes of the issues that occurred and propose measures to help prevent recurrence and improve the situation. Utilizing over 40 years of experience and expertise within the Toray Group, we employ various tools such as electron microscopes and component analysis devices to address our customers' inquiries. 【Examples of Analysis Equipment】 ■ Scanning Electron Microscope (SEM) ■ Energy Dispersive X-ray Spectroscopy (EDS) ■ Hardness Tester ■ Various Optical Microscopes, etc.

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  • Structural Survey

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Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Even with SiC power devices, we can provide consistent support for cross-section preparation of specific areas, observation of diffusion layer shapes, as well as wiring structure and crystal structure analysis!

Our company conducts observations of the diffusion layer of SiC MOSFETs using LV-SEM and EBIC methods. We can perform cross-section fabrication of specific areas using FIB, shape observation of the diffusion layer using LV-SEM/EBIC, and further through-analysis of wiring structures and crystal structures using TEM, all applicable to SiC power devices. In "LV-SEM diffusion layer observation," secondary electrons (SE2) affected by the built-in potential of the PN junction are detected using the Inlens detector. The shape of the diffusion layer can be visualized through SEM observation of the FIB cross-section. 【Analysis methods using EBIC】 ■ PEM/OBIRCH defect location identification ■ FIB cross-section processing ■ Low acceleration SEM ■ EBIC analysis ■ TEM *For more details, please refer to the PDF document or feel free to contact us.

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Observation of cracks using a tabletop SEM (Scanning Electron Microscope)

Observation of cracks using a tabletop SEM (Scanning Electron Microscope)

Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.

This is an introduction to "Crack Observation Using Desktop SEM (Scanning Electron Microscope)." In the evaluation of product reliability, cross-sectional observation of cracks is essential. Even small cracks that may be overlooked in optical microscopy can be clearly identified through SEM observation. Moreover, with a desktop SEM, there is no need for conductive treatment, allowing for quick and detailed observation. 【Features】 ■ No deposition required ■ Easy visibility of crystal grains ■ Fine cracks are easily visible *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope).

[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope).

We have published cross-sectional observations in bright field mode and normal/standard mode!

This document introduces the cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope). Samples with magnetic properties, such as neodymium magnets, cannot be observed in a magnetized state using SEM, but by applying demagnetization treatment, SEM observation and elemental analysis can be performed. Please take a moment to read it. 【Contents】 ■ Demagnetization of neodymium magnets and cross-sectional observation using SEM (Hitachi High-Tech TM3030Plus) - Demagnetization treatment (SEM observation of magnets in a magnetized state is not possible, so demagnetization is performed) - Cross-sectional observation - Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.

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FE-SEM observation (Crystal grain observation of Al wire bonding section)

FE-SEM observation (Crystal grain observation of Al wire bonding section)

High-brightness electron gun for detailed SEM images! Equipped with an in-lens SE detector sensitive to surface information.

The ZEISS "FE-SEM ULTRA55" is equipped with a GEMINI column, allowing for high-resolution observation at extremely low acceleration voltages. It also features multiple detectors, enabling the observation of various samples. Composition information can be obtained using two types of backscattered electron detectors, and high-resolution EDX analysis is possible even at low acceleration voltages. 【Features】 ■ High-resolution SEM images with a high-brightness electron gun ■ Ultra-surface analysis at extremely low acceleration voltages ■ In-lens SE detector sensitive to surface information ■ Composition information obtained using two types of backscattered electron detectors ■ High-resolution EDX analysis even at low acceleration voltages ■ Observation without coating *For more details, please refer to the PDF document or feel free to contact us.

  • Analysis and prediction system

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Observation of the coating film

Observation of the coating film

Introducing examples of observation and analysis of coating films used in various products, including "microtomes" that can perform planar inclined cutting!

We will introduce examples of observation and analysis of coating films used in various products such as automobiles and mobile phones. The "Triple Ion Polisher (CP)" can process samples containing both hard and soft materials without causing damage, while the "Microtome" is capable of not only producing cross-sections but also performing planar inclined cutting. Additionally, the "Desktop Oblique Cutting Machine" can extract sample surfaces that are 6 to 300 times the original thickness as surface information, and the "Desktop SEM (Scanning Electron Microscope)" has a mode for observation under low vacuum (charge reduction), allowing for the observation and elemental analysis of samples that release volatile components. [Observation of Plastic Coating (Mobile Phone Case)] - Triple Ion Polisher (CP) - Microtome - Desktop Oblique Cutting Machine - Desktop SEM (Scanning Electron Microscope) *For more details, please refer to the PDF document or feel free to contact us.

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Technical Data: Electrode Deposits (Contacts)

Technical Data: Electrode Deposits (Contacts)

Introducing a case study that investigated contact surfaces with poor conductivity through electron microscope observation!

Our company is engaged in the analysis solutions business. This document presents cases where non-contact, non-destructive observation of contact surfaces that experienced poor conductivity was conducted using an electron microscope at magnifications of 40 to 250 times, allowing for the observation of contaminants on the contact surfaces. By identifying the contaminants on the contacts through qualitative elemental analysis using fluorescence X-ray analysis and qualitative compound analysis using micro-infrared spectroscopy, we can elucidate the adhesion mechanisms of the identified contaminants to the contacts, enabling an investigation into the causes of poor conductivity. [Contents] ■ Overview ■ Features ■ Analysis Cases - Electron Microscope Observation - Fluorescence X-ray Analysis, Micro-infrared Spectroscopy *For more details, please refer to the PDF document or feel free to contact us.

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Technical Data: Low Vacuum SEM (Observation and Evaluation of Adhesive Interfaces)

Technical Data: Low Vacuum SEM (Observation and Evaluation of Adhesive Interfaces)

Introduction to observation and evaluation analysis of low vacuum SEM that does not require coating processes such as vacuum deposition!

Our company is engaged in the analysis solution business. In low vacuum SEM, coating treatments (pre-treatments) such as vacuum deposition are not required for sample preparation. Even for samples such as insulators, semiconductors, and food, after low vacuum SEM observation without coating treatment, they can be directly used for other analyses. [Contents] ■ Overview ■ Analysis Examples ・ Observation and evaluation of adhesive interfaces *For more details, please refer to the PDF document or feel free to contact us.

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Basic Analysis Techniques for Similar but Different Objects

Basic Analysis Techniques for Similar but Different Objects

Introducing the flow from optical microscope observation, which has a wide range of applications, to SEM observation and EDX elemental analysis!

We will introduce the flow from basic and widely applicable optical microscopy observations to SEM observations and EDX elemental analysis. Observation using optical microscopy is one of the fundamental observation techniques and allows for quick examination of general shapes. Additionally, its feature is that it provides color information, making it useful for observing abnormalities associated with corrosion and other changes. In this document, we also provide detailed explanations of "SEM observations" and "EDX elemental analysis" using photos and graphs. Please take a moment to read it. 【Contents】 ■ Observation using optical microscopy ■ Observation using SEM ■ Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.

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Announcement of the introduction of Talos F200E

Announcement of the introduction of Talos F200E

Improved resolution of TEM and STEM! Performance has been significantly enhanced, allowing EDS analysis with four detectors.

Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, including the capability for EDS analysis with four detectors. Additionally, it is equipped with Drift Corrected Frame Integration (DCFI), which allows for the integration of multiple frames while correcting for drift. 【Specifications (excerpt)】 ■ Acceleration Voltage: 200kV, 80kV ■ TEM Information Limit: ≦0.11nm ■ STEM Resolution: ≦0.14nm ■ Drift Corrected Frame Integration (DCFI) ・Integrates multiple frames while correcting for drift *For more details, please download the PDF or feel free to contact us.

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Technical Data: Low Vacuum SEM

Technical Data: Low Vacuum SEM

Introducing a case study that analyzed the cross-sectional structure of solar panels using only cutting and polishing as a preprocessing method!

Our company is engaged in the analysis solution business. This document presents a case study where the cross-sectional structure of an insulator solar panel composed of organic-inorganic composites was analyzed using low vacuum SEM and FT-IR, with only cutting and polishing as the pretreatment. In low vacuum SEM, coating treatments such as vacuum deposition are not required as pretreatment for the samples. For samples such as insulators, semiconductors, and food, it is possible to conduct other analyses directly after low vacuum SEM observation without any coating treatment. [Contents] ■ Overview ■ Analysis Case ・ Analysis of Solar Panels (Insulators) *For more details, please refer to the PDF document or feel free to contact us.

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"Contract analysis services in a non-contact air environment" *Analysis sample materials provided*

"Contract analysis services in a non-contact air environment" *Analysis sample materials provided*

Such as Na, Mg, and Li. Supporting the development of new materials and new products in the fields of automobiles, electronic devices, and mechanical components.

Our company offers "analysis services tailored to individual needs." Among these, we provide "analysis services in a non-contact air environment," which allows for the analysis of substances such as lithium, sodium, and potassium that change their surface state when exposed to moisture and oxygen in the air, while keeping them in an active state. We respond to needs in research and development of new materials and products in the automotive, electronics, chemical, and mechanical parts industries, including the development of new materials and products, discovery of hidden properties, and verification of fundamental data. ◎ Examples of requests - I want to know if the thermal decomposition behavior of oil that has dissolved during the manufacturing process differs in an atmosphere of hydrogen, nitrogen, or other gases. - I want to know if alloys react with atmospheric gases such as hydrogen and nitrogen, and what the reaction temperatures are. - I want to understand how the data changes when the atmosphere is altered. ◎ Items handled Scanning Electron Microscope (SEM) Thermogravimetric, Differential Thermal, and Temperature-Programmed Desorption Mass Spectrometry (TG-DTA-MS) Powder X-ray Diffraction (XRD) Pressure-Composition Isotherm (PCT) measurement High-Pressure Differential Scanning Calorimetry (DSC) Fourier Transform Infrared Spectroscopy (FT-IR) *Analysis samples in a non-contact air environment can be viewed via PDF download. Please feel free to contact us for inquiries or analysis requests.

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